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52![Application Note 088 full Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 Application Note 088 full Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1](https://www.pdfsearch.io/img/95a9eeadff0bb80103bfd357dfe6596d.jpg) | Add to Reading ListSource URL: ntmdt.comLanguage: English - Date: 2015-03-27 07:58:14
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53![Application Note 088 full Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 Application Note 088 full Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1](https://www.pdfsearch.io/img/5ae057944fd8d90cbdb26c367cb1be34.jpg) | Add to Reading ListSource URL: www.ntmdt.comLanguage: English - Date: 2015-03-27 07:58:14
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54![Chapter 6: Materials Protection and Surface Technology Unique Test Facilities Atomic Force Microscope (AFM) and Tribometer in Ultra-high Vacuum Keywords Chapter 6: Materials Protection and Surface Technology Unique Test Facilities Atomic Force Microscope (AFM) and Tribometer in Ultra-high Vacuum Keywords](https://www.pdfsearch.io/img/83cbf26289af6ad88b523f9150239721.jpg) | Add to Reading ListSource URL: www.bam.deLanguage: English - Date: 2015-02-04 09:11:39
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55![B.J. Jones “Commentary on “Evaluation of Shooting Distance by AFM and FTIR⁄ATR Analysis of GSR” Mou Y., Lakadwar J., Rabalais J.W., J. Forensic Sci. 2008; 53:1381-6” Journal of Forensic Sciences[removed]A B.J. Jones “Commentary on “Evaluation of Shooting Distance by AFM and FTIR⁄ATR Analysis of GSR” Mou Y., Lakadwar J., Rabalais J.W., J. Forensic Sci. 2008; 53:1381-6” Journal of Forensic Sciences[removed]A](https://www.pdfsearch.io/img/92d8a8ae768c837fde08048e783e604e.jpg) | Add to Reading ListSource URL: bura.brunel.ac.ukLanguage: English - Date: 2014-11-01 08:12:27
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56![Park Systems Hosts 2013 Annual Boston User Group Meeting, Luncheon, and Roadshow on Behalf of Atomic Force Microscopy (AFM) Oct 21 and 22 Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, an Park Systems Hosts 2013 Annual Boston User Group Meeting, Luncheon, and Roadshow on Behalf of Atomic Force Microscopy (AFM) Oct 21 and 22 Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, an](https://www.pdfsearch.io/img/e8a004e7cd401c4c970d0da9f6ea3e79.jpg) | Add to Reading ListSource URL: www.prweb.comLanguage: English - Date: 2013-10-08 17:00:14
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57![Microsoft Word - AFM-10-unpersoenlich.doc Microsoft Word - AFM-10-unpersoenlich.doc](https://www.pdfsearch.io/img/812c276940219167383b7f1da327fe8f.jpg) | Add to Reading ListSource URL: polymerscience.physik.hu-berlin.deLanguage: English - Date: 2011-12-05 13:32:51
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58![Microsoft Word - AFM-10-unpersoenlich.doc Microsoft Word - AFM-10-unpersoenlich.doc](https://www.pdfsearch.io/img/a4309cb1d65a830a39cdbeae0eb85ebf.jpg) | Add to Reading ListSource URL: polymerscience.physik.hu-berlin.deLanguage: English - Date: 2011-12-08 03:26:50
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59![Intermolecular forces / Chemistry / Nanotechnology / Atomic force microscopy / Microscope / Cantilever / Canton of Neuchâtel / Photoconductive atomic force microscopy / Scanning probe microscopy / Science / Scientific method Intermolecular forces / Chemistry / Nanotechnology / Atomic force microscopy / Microscope / Cantilever / Canton of Neuchâtel / Photoconductive atomic force microscopy / Scanning probe microscopy / Science / Scientific method](/pdf-icon.png) | Add to Reading ListSource URL: www.uwstout.eduLanguage: English - Date: 2011-10-28 14:09:31
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60![Advanced Robotics Journal, Vol. X, No. Y, 2002 (to appear) SCALED TELEOPERATION SYSTEM FOR NANO SCALE INTERACTION AND MANIPULATION Metin Sitti,1,∗ Baris Aruk,2 Hirohaki Shintani2 and Hideki Hashimoto2 1 Mechanical Advanced Robotics Journal, Vol. X, No. Y, 2002 (to appear) SCALED TELEOPERATION SYSTEM FOR NANO SCALE INTERACTION AND MANIPULATION Metin Sitti,1,∗ Baris Aruk,2 Hirohaki Shintani2 and Hideki Hashimoto2 1 Mechanical](https://www.pdfsearch.io/img/b51ef6dea69822b9ca732fb36801c712.jpg) | Add to Reading ListSource URL: nanolab.me.cmu.eduLanguage: English - Date: 2012-11-16 19:15:37
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